Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)
Editorial Reviews
Review
'... an excellent introduction to the field. The book is well organised, has a good index and there are numerous diagrams and figures supporting throughout. Overall, this is a super book that will rapidly become a standard text and a must for the library of any serious surface or polymer group.' Martyn C. Davies, Chemistry in Britain
' ... a useful introductory text on the subject ... The book is well produced and leads the reader clearly through the basic principles to the more subtle features of the topic. I can recommend this publication to those wishing to gain a better understanding of the way to characterise such materials using these techniques.' C. A. Finch, Polymer International
' ... the author is to be congratulated on achieving his aim of an 'in-depth' treatment of the subject matter in a concise and readable style. This is excellent value for money and is thoroughly recommended to all practising, or aspiring, surface analysts with an interest in polymers.' John F. Watts, The Analyst
Book Description
This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)
Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series),D. Briggs,D. R. Clarke,S. Suresh,I. M. Ward,Cambridge University Press,0521352223,Analysis,Chemistry - Organic,Engineering - General,Material Science,Polymer Chemistry,Polymers,Science,Science/Mathematics,Secondary ion mass spectrometr,Secondary ion mass spectrometry,Spectrochemistry,Spectroscopy & Spectrum Analysis,Surfaces,Technology & Industrial Arts,X-ray spectroscopy,Mechanical Engineering & Materials,Organic chemistry,Polymers--Surfaces--Analysis,Technology / Material Science
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